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Newcastle University in conjunction with Bruker Nano Surfaces Metrology would like to invite you to their Nanoscale Characterisation Workshop – covering the Dimension XR SPM /AFM system, being held on the 6th June.

The goal of the workshop is to share the latest developments and capabilities of the Scanning Probe Microscopy for studying micro and nano-chemical, nano-electrical and nano-mechanical properties of surfaces.

For further details and to Register, please click here:

External URL: https://mbns.bruker.com/acton/fs/blocks/showLandingPage/a/9063/p/p-0360/t/page/fm/4